Atomic Force Microscopy

Scanning probe microscopy (SPM) is an imaging technique which provides a 3-D and structural analysis of surfaces from mesoscopic scale to atomic resolution. SPM is based on scanning a surface with a probe/tip, during which information about surface topography, electronic structure or interaction force between surface and probe can be obtained.

Atomic force microscopy (AFM) is a high-resolution type of SPM, which provides surface topography profiles on the order of fractions of a nanometer.

Why choose the University of Edinburgh School of Chemistry as a partner for your AFM needs?

  • Discuss your project with expert researchers, who can customize techniques and ways of acquiring AFM or other SPM images according to your needs.

  • Get training on SPM for your specific application and access the instrument yourself with real time help available from expert researchers

  • Off-line analysis of images can be accessed to provide detailed information on surface roughness, particle size analysis, surface conductivity etc

We Can Answer Your Questions

“What are the properties of the surface of this material? 
AFM
AFM is well suited for measurements of surface characteristics such as topography, conductivity, adhesive force, nanomechanical and frictional properties of a sample. This makes it a useful tool for a wide range of applications and samples including:
  • Semiconductor wafers (max wafer size 200mm)
  • Lithography masks
  • Magnetic media
  • CDs/DVDs
  • Biomaterials (e.g. conformation properties of proteins and DNA)

SERVICES AVAILABLE

The instrument can perform:

  • AFM surface topography measurements in contact and/or tapping mode

  • Magnetic force microscopy

  • Force spectroscopy experiments (e.g. adhesive surface maps)

  • Tunnelling AFM (TUNA) (Bias ±12 V, current sensitivity 1 pA - 10 nA) – conductivity maps

  • Manipulation of objects in nanometer and micrometer scale on substrates. Max. scan size 100 microns

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